HEXFET
®
Power MOSFET
Benefits
l
Improved Gate, Avalanche and Dynamic dV/dt
Ruggedness
l
Fully Characterized Capacitance and Avalanche
SOA
l
Enhanced body diode dV/dt and dI/dt Capability
l
Lead-Free
l
RoHS Compliant, Halogen-Free
Applications
l
High Efficiency Synchronous Rectification in SMPS
l
Uninterruptible Power Supply
l
High Speed Power Switching
l
Hard Switched and High Frequency Circuits
D
2
Pak
IRFS3306PbF
TO-220AB
IRFB3306PbF
TO-262
IRFSL3306PbF
S
D
G
S
D
G
S
D
G
D
D
D
G
D
S
Gate
Drain
Source
S
D
G
V
DSS
60V
R
DS(on)
typ.
3.3m:
max.
4.2m
:
I
D
(Silicon Limited)
160A c
I
D
(Package Limited)
120A
IRFB3306PbF
IRFS3306PbF
IRFSL3306PbF
1
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2014 International Rectifier
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April 24, 2014
Absolute Maximum Ratings
Symbol
Parameter
Units
I
D
@ T
C
= 25°C
Continuous Drain Current, V
GS
@ 10V (Silicon Limited)
I
D
@ T
C
= 100°C
Continuous Drain Current, V
GS
@ 10V (Silicon Limited)
I
D
@ T
C
= 25°C
Continuous Drain Current, V
GS
@ 10V (Wire Bond Limited)
I
DM
Pulsed Drain Current d
P
D
@T
C
= 25°C
Maximum Power Dissipation
W
Linear Derating Factor
W/°C
V
GS
Gate-to-Source Voltage
V
dv/dt
Peak Diode Recovery f
V/ns
T
J
Operating Junction and
T
STG
Storage Temperature Range
Soldering Temperature, for 10 seconds
(1.6mm from case)
Mounting torque, 6-32 or M3 screw
Avalanche Characteristics
E
AS (Thermally limited)
Single Pulse Avalanche Energy e
mJ
I
AR
Avalanche Currentd
A
E
AR
Repetitive Avalanche Energy g
mJ
Thermal Resistance
Symbol
Parameter
Typ.
Max.
Units
R
θJC
Junction-to-Case k
–––
0.65
R
θCS
Case-to-Sink, Flat Greased Surface , TO-220
0.50
–––
R
θJA
Junction-to-Ambient, TO-220 k
–––
62
R
θJA
Junction-to-Ambient (PCB Mount) , D
2
Pak jk
–––
40
A
°C
°C/W
300
184
See Fig. 14, 15, 22a, 22b,
230
14
-55 to + 175
± 20
1.5
10lbx in (1.1Nx m)
Max.
160c
110c
620
120
Form
Quantity
IRFB3306PbF
TO-220
Tube
50
IRFB3306PbF
IRFSL3306PbF
TO-262
Tube
50
IRFSL3306PbF
Tube
50
IRFS3306PbF
Tape and Reel Left
800
IRFS3306TRLPbF
Tape and Reel Right
800
IRFS3306TRRPbF
Base Part Number
Package Type
Standard Pack
Orderable Part Number
IRFS3306PbF
D2Pak
2
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April 24, 2014
IRFB3306PbF/IRFS3306PbF/IRFSL3306PbF
Notes:
Calculated continuous current based on maximum allowable junction
temperature. Bond wire current limit is 120A. Note that current
limitations arising from heating of the device leads may occur with
some lead mounting arrangements.
Repetitive rating; pulse width limited by max. junction
temperature.
Limited by T
Jmax
, starting T
J
= 25°C, L = 0.04mH
R
G
= 25
Ω, I
AS
= 96A, V
GS
=10V. Part not recommended for use
above this value.
S
D
G
I
SD
≤ 75A, di/dt ≤ 1400A/μs, V
DD
≤ V
(BR)DSS
, T
J
≤ 175°C.
Pulse width ≤ 400μs; duty cycle ≤ 2%.
C
oss
eff. (TR) is a fixed capacitance that gives the same charging time
as C
oss
while V
DS
is rising from 0 to 80% V
DSS
.
C
oss
eff. (ER) is a fixed capacitance that gives the same energy as
C
oss
while V
DS
is rising from 0 to 80% V
DSS
.
When mounted on 1" square PCB (FR-4 or G-10 Material). For recom
mended footprint and soldering techniques refer to application note #AN-994.
R
θ
is measured at T
J
approximately 90°C
Static @ T
J
= 25°C (unless otherwise specified)
Symbol
Parameter
Min. Typ. Max. Units
V
(BR)DSS
Drain-to-Source Breakdown Voltage
60
–––
–––
V
ΔV
(BR)DSS
/
ΔT
J
Breakdown Voltage Temp. Coefficient
–––
0.07
–––
V/°C
R
DS(on)
Static Drain-to-Source On-Resistance
–––
3.3
4.2
m
Ω
V
GS(th)
Gate Threshold Voltage
2.0
–––
4.0
V
I
DSS
Drain-to-Source Leakage Current
–––
–––
20
μA
–––
–––
250
I
GSS
Gate-to-Source Forward Leakage
–––
–––
100
nA
Gate-to-Source Reverse Leakage
–––
–––
-100
R
G
Internal Gate Resistance
–––
0.7
–––
Ω
Dynamic @ T
J
= 25°C (unless otherwise specified)
Symbol
Parameter
Min. Typ. Max. Units
gfs
Forward Transconductance
230
–––
–––
S
Q
g
Total Gate Charge
–––
85
120
nC
Q
gs
Gate-to-Source Charge
–––
20
–––
Q
gd
Gate-to-Drain ("Miller") Charge
–––
26
Q
sync
Total Gate Charge Sync. (Q
g
- Q
gd
)
–––
59
–––
t
d(on)
Turn-On Delay Time
–––
15
–––
ns
t
r
Rise Time
–––
76
–––
t
d(off)
Turn-Off Delay Time
–––
40
–––
t
f
Fall Time
–––
77
–––
C
iss
Input Capacitance
–––
4520
–––
pF
C
oss
Output Capacitance
–––
500
–––
C
rss
Reverse Transfer Capacitance
–––
250
–––
C
oss
eff. (ER) Effective Output Capacitance (Energy Related) –––
720
–––
C
oss
eff. (TR) Effective Output Capacitance (Time Related)
h
–––
880
–––
Diode Characteristics
Symbol
Parameter
Min. Typ. Max. Units
I
S
Continuous Source Current
–––
––– 160
c
A
(Body Diode)
I
SM
Pulsed Source Current
–––
–––
620
A
(Body Diode)
d
V
SD
Diode Forward Voltage
–––
–––
1.3
V
t
rr
Reverse Recovery Time
–––
31
ns
T
J
= 25°C
V
R
= 51V,
–––
35
T
J
= 125°C
I
F
= 75A
Q
rr
Reverse Recovery Charge
–––
34
nC T
J
= 25°C
di/dt = 100A/μs
g
–––
45
T
J
= 125°C
I
RRM
Reverse Recovery Current
–––
1.9
–––
A
T
J
= 25°C
t
on
Forward Turn-On Time
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Conditions
V
DS
= 50V, I
D
= 75A
I
D
= 75A
V
GS
= 20V
V
GS
= -20V
MOSFET symbol
showing the
V
DS
=30V
Conditions
V
GS
= 10V
g
V
GS
= 0V
V
DS
= 50V
ƒ = 1.0MHz, See Fig. 5
V
GS
= 0V, V
DS
= 0V to 48V
i
, See Fig. 11
V
GS
= 0V, V
DS
= 0V to 48V
h
T
J
= 25°C, I
S
= 75A, V
GS
= 0V
g
integral reverse
p-n junction diode.
Conditions
V
GS
= 0V, I
D
= 250μA
Reference to 25°C, I
D
= 5mA
d
V
GS
= 10V, I
D
= 75A
g
V
DS
= V
GS
, I
D
= 150μA
V
DS
= 60V, V
GS
= 0V
V
DS
= 48V, V
GS
= 0V, T
J
= 125°C
I
D
= 75A
R
G
= 2.7Ω
V
GS
= 10V
g
V
DD
= 30V
I
D
= 75A, V
DS
=0V, V
GS
= 10V
3
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April 24, 2014
IRFB3306PbF/IRFS3306PbF/IRFSL3306PbF
Fig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance vs. Temperature
Fig 2. Typical Output Characteristics
Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage
Fig 5. Typical Capacitance vs. Drain-to-Source Voltage
0.1
1
10
100
VDS, Drain-to-Source Voltage (V)
10
100
1000
I D
, D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
≤ 60μs PULSE WIDTH
Tj = 25°C
4.5V
VGS
TOP
15V
10V
8.0V
6.0V
5.5V
5.0V
4.8V
BOTTOM
4.5V
0.1
1
10
100
VDS, Drain-to-Source Voltage (V)
10
100
1000
I D
, D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
≤ 60μs PULSE WIDTH
Tj = 175°C
4.5V
VGS
TOP
15V
10V
8.0V
6.0V
5.5V
5.0V
4.8V
BOTTOM
4.5V
2.0
3.0
4.0
5.0
6.0
7.0
8.0
VGS, Gate-to-Source Voltage (V)
0.1
1
10
100
1000
I D
, D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(Α
)
VDS = 25V
≤ 60μs PULSE WIDTH
TJ = 25°C
TJ = 175°C
-60 -40 -20 0
20 40 60 80 100 120 140 160 180
TJ , Junction Temperature (°C)
0.5
1.0
1.5
2.0
2.5
R
D
S
(o
n)
,
D
ra
in
-t
o-
S
ou
rc
e
O
n
R
es
is
ta
nc
e
(
N
or
m
al
iz
ed
)
ID = 75A
VGS = 10V
1
10
100
VDS, Drain-to-Source Voltage (V)
0
2000
4000
6000
8000
C
, C
ap
ac
ita
nc
e
(p
F
)
Coss
Crss
Ciss
VGS = 0V, f = 1 MHZ
Ciss = Cgs + Cgd, Cds SHORTED
Crss = Cgd
Coss = Cds + Cgd
0
20
40
60
80
100
120
140
QG Total Gate Charge (nC)
0
4
8
12
16
20
V
G
S
, G
at
e-
to
-S
ou
rc
e
V
ol
ta
ge
(
V
)
VDS= 48V
VDS= 30V
VDS= 12V
ID= 75A
4
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IRFB3306PbF/IRFS3306PbF/IRFSL3306PbF
Fig 8. Maximum Safe Operating Area
Fig 10. Drain-to-Source Breakdown Voltage
Fig 7. Typical Source-Drain Diode
Forward Voltage
Fig 11. Typical C
OSS
Stored Energy
Fig 9. Maximum Drain Current vs.
Case Temperature
Fig 12. Maximum Avalanche Energy Vs. DrainCurrent
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
VSD, Source-to-Drain Voltage (V)
0.1
1
10
100
1000
I S
D
, R
ev
er
se
D
ra
in
C
ur
re
nt
(
A
)
TJ = 25°C
TJ = 175°C
VGS = 0V
0
10
20
30
40
50
60
VDS, Drain-to-Source Voltage (V)
0.0
0.5
1.0
1.5
E
ne
rg
y
(μ
J)
0.1
1
10
100
VDS, Drain-toSource Voltage (V)
0.1
1
10
100
1000
10000
I D
,
D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
Tc = 25°C
Tj = 175°C
Single Pulse
1msec
10msec
OPERATION IN THIS AREA
LIMITED BY R DS(on)
100μsec
DC
-60 -40 -20 0
20 40 60 80 100 120 140 160 180
TJ , Junction Temperature (°C)
50
60
70
80
V
(B
R
)D
S
S
,
D
ra
in
-t
o-
S
ou
rc
e
B
re
ak
do
w
n
V
ol
ta
ge
ID = 5mA
25
50
75
100
125
150
175
TC , Case Temperature (°C)
0
20
40
60
80
100
120
140
160
180
I D
,
D
ra
in
C
ur
re
nt
(
A
)
Limited By Package
25
50
75
100
125
150
175
Starting TJ, Junction Temperature (°C)
0
200
400
600
800
E
A
S
,
S
in
gl
e
P
ul
se
A
va
la
nc
he
E
ne
rg
y
(m
J)
I D
TOP
13A
18A
BOTTOM
96A
5
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April 24, 2014
IRFB3306PbF/IRFS3306PbF/IRFSL3306PbF
1E-006
1E-005
0.0001
0.001
0.01
0.1
t1 , Rectangular Pulse Duration (sec)
0.0001
0.001
0.01
0.1
1
T
he
rm
al
R
es
po
ns
e
(
Z
th
JC
)
0.20
0.10
D = 0.50
0.02
0.01
0.05
SINGLE PULSE
( THERMAL RESPONSE )
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 14. Typical Avalanche Current vs.Pulsewidth
Fig 15. Maximum Avalanche Energy vs. Temperature
Notes on Repetitive Avalanche Curves , Figures 14, 15:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a temperature far in
excess of T
jmax
. This is validated for every part type.
2. Safe operation in Avalanche is allowed as long asT
jmax
is not exceeded.
3. Equation below based on circuit and waveforms shown in Figures 16a, 16b.
4. P
D (ave)
= Average power dissipation per single avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase
during avalanche).
6. I
av
= Allowable avalanche current.
7.
ΔT
=
Allowable rise in junction temperature, not to exceed
T
jmax
(assumed as
25°C in Figure 14, 15).
t
av =
Average time in avalanche.
D = Duty cycle in avalanche = t
av
·f
Z
thJC
(D, t
av
) = Transient thermal resistance, see Figures 13)
P
D (ave)
= 1/2 ( 1.3·BV·I
av
) =
DT/ Z
thJC
I
av
=
2
DT/ [1.3·BV·Z
th
]
E
AS (AR)
= P
D (ave)
·t
av
Ri (°C/W)
τι (sec)
0.249761
0.00028
0.400239 0.005548
τ
J
τ
J
τ
1
τ
1
τ
2
τ
2
R
1
R
1
R
2
R
2
τ
C
C
Ci=
τi/Ri
25
50
75
100
125
150
175
Starting TJ , Junction Temperature (°C)
0
40
80
120
160
200
E
A
R
,
A
va
la
nc
he
E
ne
rg
y
(m
J)
TOP Single Pulse
BOTTOM 1% Duty Cycle
ID = 96A
1.0E-06
1.0E-05
1.0E-04
1.0E-03
1.0E-02
1.0E-01
tav (sec)
1
10
100
A
va
la
nc
he
C
ur
re
nt
(
A
)
0.05
Duty Cycle = Single Pulse
0.10
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming
ΔΤ j = 25°C and
Tstart = 150°C.
0.01
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming
ΔTj = 150°C and
Tstart =25°C (Single Pulse)
6
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April 24, 2014
IRFB3306PbF/IRFS3306PbF/IRFSL3306PbF
Fig. 17 - Typical Recovery Current vs. di
f
/dt
Fig 16. Threshold Voltage Vs. Temperature
Fig. 19 - Typical Stored Charge vs. di
f
/dt
Fig. 18 - Typical Recovery Current vs. di
f
/dt
Fig. 20 - Typical Stored Charge vs. di
f
/dt
-75 -50 -25
0
25
50
75 100 125 150 175
TJ , Temperature ( °C )
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
V
G
S
(t
h)
G
at
e
th
re
sh
ol
d
V
ol
ta
ge
(
V
)
ID = 1.0A
ID = 1.0mA
ID = 250μA
ID = 150μA
100 200 300 400 500 600 700 800 900 1000
dif / dt - (A / μs)
0
4
8
12
16
I R
R
M
-
(
A
)
IF = 30A
VR = 51V
TJ = 125°C
TJ = 25°C
100 200 300 400 500 600 700 800 900 1000
dif / dt - (A / μs)
0
4
8
12
16
I R
R
M
-
(
A
)
IF = 45A
VR = 51V
TJ = 125°C
TJ = 25°C
100 200 300 400 500 600 700 800 900 1000
dif / dt - (A / μs)
0
50
100
150
200
250
300
350
Q
R
R
-
(
nC
)
IF = 30A
VR = 51V
TJ = 125°C
TJ = 25°C
100 200 300 400 500 600 700 800 900 1000
dif / dt - (A / μs)
0
50
100
150
200
250
300
350
Q
R
R
-
(
nC
)
IF = 45A
VR = 51V
TJ = 125°C
TJ = 25°C
7
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April 24, 2014
IRFB3306PbF/IRFS3306PbF/IRFSL3306PbF
Fig 23a. Switching Time Test Circuit
Fig 23b. Switching Time Waveforms
V
GS
V
DS
90%
10%
t
d(on)
t
d(off)
t
r
t
f
V
GS
Pulse Width < 1μs
Duty Factor < 0.1%
V
DD
V
DS
L
D
D.U.T
+
-
Fig 22b. Unclamped Inductive Waveforms
Fig 22a. Unclamped Inductive Test Circuit
tp
V
(BR)DSS
I
AS
RG
IAS
0.01
Ω
tp
D.U.T
L
VDS
+
- VDD
DRIVER
A
15V
20V
V
GS
Fig 24a. Gate Charge Test Circuit
Fig 24b. Gate Charge Waveform
Vds
Vgs
Id
Vgs(th)
Qgs1 Qgs2
Qgd
Qgodr
Fig 21.
Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET
®
Power MOSFETs
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
P.W.
Period
di/dt
Diode Recovery
dv/dt
Ripple
≤ 5%
Body Diode Forward Drop
Re-Applied
Voltage
Reverse
Recovery
Current
Body Diode Forward
Current
V
GS
=10V
V
DD
I
SD
Driver Gate Drive
D.U.T. I
SD
Waveform
D.U.T. V
DS
Waveform
Inductor Curent
D =
P.W.
Period
*
V
GS
= 5V for Logic Level Devices
*
+
-
+
+
+
-
-
-
R
G
V
DD
• dv/dt controlled by R
G
• Driver same type as D.U.T.
• I
SD
controlled by Duty Factor "D"
• D.U.T. - Device Under Test
D.U.T
Inductor Current
D.U.T.
V
DS
I
D
I
G
3mA
V
GS
.3
μF
50K
Ω
.2
μF
12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-
8
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April 24, 2014
IRFB3306PbF/IRFS3306PbF/IRFSL3306PbF
TO-220AB packages are not recommended for Surface Mount Application.
TO-220AB Part Marking Information
TO-220AB Package Outline
Dimensions are shown in millimeters (inches)
Note: For the most current drawing please refer to IR website at:
http://www.irf.com/package/
IRFB3306
IRFB3306
PYWW?
LC LC
PART NUMBER
DATE CODE
P = LEAD-FREE
Y = LAST DIGIT OF YEAR
WW = WORK WEEK
? = ASSEMBLY SITE CODE
INTERNATIONAL
RECTIFIER LOGO
ASSEMBLY
LOT CODE
OR
YWWP
LC LC
PART NUMBER
DATE CODE
Y = LAST DIGIT OF YEAR
WW = WORK WEEK
P = LEAD-FREE
INTERNATIONAL
RECTIFIER LOGO
ASSEMBLY
LOT CODE
9
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April 24, 2014
IRFB3306PbF/IRFS3306PbF/IRFSL3306PbF
D
2
Pak Part Marking Information
D
2
Pak Package Outline
(Dimensions are shown in millimeters (inches))
Note: For the most current drawing please refer to IR website at:
http://www.irf.com/package/
FS3306
FS3306
PYWW?
YWWP
ASSEMBLY
LOT CODE
INTERNATIONAL
RECTIFIER LOGO
DATE CODE
P = LEAD-FREE
Y = LAST DIGIT OF YEAR
WW = WORK WEEK
? = ASSEMBLY SITE CODE
LC LC
PART NUMBER
OR
ASSEMBLY
LOT CODE
INTERNATIONAL
RECTIFIER LOGO
DATE CODE
Y = LAST DIGIT OF YEAR
WW = WORK WEEK
P = LEAD-FREE
LC LC
PART NUMBER
10
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April 24, 2014
IRFB3306PbF/IRFS3306PbF/IRFSL3306PbF
TO-262 Part Marking Information
TO-262 Package Outline
(Dimensions are shown in millimeters (inches))
Note: For the most current drawing please refer to IR website at:
http://www.irf.com/package/
FSL3306
PYWW?
FSL3306
YWWP
ASSEMBLY
LOT CODE
INTERNATIONAL
RECTIFIER LOGO
DATE CODE
P = LEAD-FREE
Y = LAST DIGIT OF YEAR
WW = WORK WEEK
? = ASSEMBLY SITE CODE
PART NUMBER
OR
DATE CODE
Y = LAST DIGIT OF YEAR
WW = WORK WEEK
P = LEAD-FREE
LC LC
ASSEMBLY
LOT CODE
INTERNATIONAL
RECTIFIER LOGO
PART NUMBER
LC LC