DirectFET
Power MOSFET
Typical values (unless otherwise specified)
Applicable DirectFET Outline and Substrate Outline
l
RoHS Compliant, Halogen Free
l
Lead-Free (Qualified up to 260°C Reflow)
l
Ideal for High Performance Isolated Converter
Primary Switch Socket
l
Optimized for Synchronous Rectification
l
Low Conduction Losses
l
High Cdv/dt Immunity
l
Low Profile (<0.7mm)
l
Dual Sided Cooling Compatible
l
Compatible with existing Surface Mount Techniques
l
Industrial Qualified
Fig 1. Typical On-Resistance vs. Gate Voltage
Click on the hyperlink (to the relevant technical document) for more details.
Click on the hyperlink (to the DirectFET website) for more details
Surface mounted on 1 in. square Cu board, steady state.
T
C
measured with thermocouple mounted to top (Drain) of part.
Repetitive rating; pulse width limited by max. junction temperature.
Starting T
J
= 25°C, L = 0.021mH, R
G
= 25
Ω, I
AS
= 160A.
Notes:
Fig 2. Typical On-Resistance vs. Drain Current
SB
SC
M2 M4
L4
L6
L8
DirectFET
ISOMETRIC
L8
Description
The IRF7739L1TRPbF combines the latest HEXFET® Power MOSFET Silicon technology with the advanced DirectFET
TM
packaging to achieve
the lowest on-state resistance in a package that has a footprint smaller than a D
2
PAK and only 0.7 mm profile. The DirectFET package is compatible
with existing layout geometries used in power applications, PCB assembly equipment and vapor phase, infra-red or convection soldering techniques,
when
application note AN-1035
is followed regarding the manufacturing methods and processes. The DirectFET package allows dual sided cooling
to maximize thermal transfer in power systems.
The IRF7739L1TRPbF is optimized for high frequency switching and synchronous rectification applications. The reduced total losses in the
device coupled with the high level of thermal performance enables high efficiency and low temperatures, which are key for system reliability
improvements, and makes this device ideal for high performance power converters.
V
DSS
V
GS
R
DS(on)
40V min ±20V max 0.70mΩ@ 10V
Q
g tot
Q
gd
V
gs(th)
220nC
81nC
2.8V
Absolute Maximum Ratings
Parameter
Units
V
DS
Drain-to-Source Voltage
V
V
GS
Gate-to-Source Voltage
I
D
@ T
C
= 25°C
Continuous Drain Current, V
GS
@ 10V
(Silicon Limited)
f
I
D
@ T
C
= 100°C
Continuous Drain Current, V
GS
@ 10V
(Silicon Limited)
f
A
I
D
@ T
A
= 25°C
Continuous Drain Current, V
GS
@ 10V
(Silicon Limited)
e
I
D
@ T
C
= 25°C
Continuous Drain Current, V
GS
@ 10V
(Package Limited)
f
I
DM
Pulsed Drain Current
g
E
AS
Single Pulse Avalanche Energy
h
mJ
I
AR
Avalanche Current
g
A
160
375
270
Max.
190
46
1070
±20
40
270
5.0
5.5
6.0
6.5
7.0
7.5
8.0
VGS, Gate -to -Source Voltage (V)
0
2
4
6
8
10
T
yp
ic
al
R
D
S
(o
n)
(
m
Ω
)
ID = 160A
TJ = 125°C
TJ = 25°C
0
40
80
120
160
200
ID , Drain Current (A)
0.85
0.86
0.87
0.88
0.89
0.90
0.91
0.92
0.93
T
yp
ic
al
R
D
S
(
on
)
(m
Ω
)
VGS = 10V
D
D
G
S
S
S
S
S
S
S
S
IRF7739L1TRPbF
Applications
1
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©
2012 International Rectifier February 13 ,2013
Ordering Information
Base part number
Package Type
Orderable Part Number
Form
Quantity
IRF7739L1TRPbF
DirectFET Large Can
Tape and Reel
4000
IRF7739L1TRPbF
Standard Pack
2
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©
2012 International Rectifier February 13 ,2013
IRF7739L1TRPbF
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Pulse width ≤ 400μs; duty cycle ≤ 2%.
Static @ T
J
= 25°C (unless otherwise specified)
Parameter
Min. Typ. Max. Units
BV
DSS
Drain-to-Source Breakdown Voltage
40
–––
–––
V
ΔΒV
DSS
/
ΔT
J
Breakdown Voltage Temp. Coefficient
–––
0.008
–––
V/°C
R
DS(on)
Static Drain-to-Source On-Resistance
–––
0.70
1.0
mΩ
V
GS(th)
Gate Threshold Voltage
2.0
2.8
4.0
V
ΔV
GS(th)
/ΔT
J
Gate Threshold Voltage Coefficient
–––
-6.7
––– mV/°C
I
DSS
Drain-to-Source Leakage Current
–––
–––
20
μA
–––
–––
250
I
GSS
Gate-to-Source Forward Leakage
–––
–––
100
nA
Gate-to-Source Reverse Leakage
–––
–––
-100
gfs
Forward Transconductance
280
–––
–––
S
Q
g
Total Gate Charge
–––
220
330
Q
gs1
Pre-Vth Gate-to-Source Charge
–––
46
–––
Q
gs2
Post-Vth Gate-to-Source Charge
–––
19
–––
nC
Q
gd
Gate-to-Drain Charge
–––
81
120
Q
godr
Gate Charge Overdrive
–––
74
–––
See Fig. 9
Q
sw
Switch Charge (Q
gs2
+ Q
gd
)
–––
100
–––
Q
oss
Output Charge
–––
83
–––
nC
R
G
Gate Resistance
–––
1.5
–––
Ω
t
d(on)
Turn-On Delay Time
–––
21
–––
t
r
Rise Time
–––
71
–––
t
d(off)
Turn-Off Delay Time
–––
56
–––
ns
t
f
Fall Time
–––
42
–––
C
iss
Input Capacitance
–––
11880 –––
C
oss
Output Capacitance
–––
2510
–––
pF
C
rss
Reverse Transfer Capacitance
–––
1240
–––
C
oss
Output Capacitance
–––
8610
–––
C
oss
Output Capacitance
–––
2230
–––
Diode Characteristics
Parameter
Min. Typ. Max. Units
I
S
Continuous Source Current
–––
–––
110
(Body Diode)
A
I
SM
Pulsed Source Current
–––
–––
1070
(Body Diode)
g
V
SD
Diode Forward Voltage
–––
–––
1.3
V
t
rr
Reverse Recovery Time
–––
87
130
ns
Q
rr
Reverse Recovery Charge
–––
250
380
nC
MOSFET symbol
R
G
=1.8
Ω
V
DS
= 25V
Conditions
V
GS
= 0V, V
DS
= 32V, f=1.0MHz
V
GS
= 0V, V
DS
= 1.0V, f=1.0MHz
V
DS
= 16V, V
GS
= 0V
V
DD
= 20V, V
GS
= 10V
i
V
GS
= 0V
ƒ = 1.0MHz
I
D
= 160A
V
DS
= V
GS
, I
D
= 250μA
V
DS
= 40V, V
GS
= 0V
Conditions
V
GS
= 0V, I
D
= 250μA
Reference to 25°C, I
D
= 1.0mA
V
GS
= 10V, I
D
= 160A
i
T
J
= 25°C, I
F
= 160A, V
DD
= 20V
di/dt = 100A/μs
i
T
J
= 25°C, I
S
= 160A, V
GS
= 0V
i
showing the
integral reverse
p-n junction diode.
I
D
= 160A
V
DS
= 32V, V
GS
= 0V, T
J
= 125°C
V
GS
= 20V
V
GS
= -20V
V
GS
= 10V
V
DS
= 10V, I
D
= 160A
V
DS
= 20V
3
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IRF7739L1TRPbF
Fig 3. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Surface mounted on 1 in. square Cu board, steady state.
T
C
measured with thermocouple incontact with top (Drain) of part.
Used double sided cooling, mounting pad with large heatsink.
Notes:
Mounted on minimum footprint full size board with metalized
back and with small clip heatsink.
R
θ
is measured at T
J
of approximately 90°C.
Surface mounted on 1 in. square Cu
board (still air).
Mounted on minimum footprint full size board with metalized
back and with small clip heatsink. (still air)
1E-006
1E-005
0.0001
0.001
0.01
0.1
1
t1 , Rectangular Pulse Duration (sec)
0.0001
0.001
0.01
0.1
1
10
T
he
rm
al
R
es
po
ns
e
(
Z
th
JC
)
°
C
/W
0.20
0.10
D = 0.50
0.02
0.01
0.05
SINGLE PULSE
( THERMAL RESPONSE )
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
τ
J
τ
J
τ
1
τ
1
τ
2
τ
2
τ
3
τ
3
R
1
R
1
R
2
R
2
R
3
R
3
Ci i
/Ri
Ci=
τi/Ri
τ
τ
C
τ
4
τ
4
R
4
R
4
Ri (°C/W)
τi (sec)
0.1080 0.000171
0.6140 0.053914
0.4520 0.006099
1.47e-05 0.036168
Absolute Maximum Ratings
Parameter
Units
P
D
@T
C
= 25°C
Power Dissipation
f
W
P
D
@T
C
= 100°C
Power Dissipation
f
P
D
@T
A
= 25°C
Power Dissipation
c
T
P
Peak Soldering Temperature
°C
T
J
Operating Junction and
T
STG
Storage Temperature Range
Thermal Resistance
Parameter
Typ.
Max.
Units
R
θJA
Junction-to-Ambient
e
–––
40
R
θJA
Junction-to-Ambient
j
12.5
–––
R
θJA
Junction-to-Ambient
k
20
–––
°C/W
R
θJ-Can
Junction-to-Can
fl
–––
1.2
R
θJ-PCB
Junction-to-PCB Mounted
–––
0.4
270
-55 to + 175
Max.
3.8
125
63
4
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IRF7739L1TRPbF
Fig 5. Typical Output Characteristics
Fig 4. Typical Output Characteristics
Fig 6. Typical Transfer Characteristics
Fig 7. Normalized On-Resistance vs. Temperature
Fig 8. Typical Capacitance vs. Drain-to-Source Voltage
Fig 9. Typical Total Gate Charge vs.
Gate-to-Source Voltage
0.1
1
10
100
1000
VDS, Drain-to-Source Voltage (V)
0.1
1
10
100
1000
I D
, D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
VGS
TOP
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
≤60μs PULSE WIDTH
Tj = 25°C
4.5V
0.1
1
10
100
1000
VDS, Drain-to-Source Voltage (V)
10
100
1000
I D
, D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
4.5V
≤60μs PULSE WIDTH
Tj = 175°C
VGS
TOP
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
2
3
4
5
6
7
8
VGS, Gate-to-Source Voltage (V)
0.1
1
10
100
1000
I D
, D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
TJ = 25°C
TJ = 175°C
VDS = 25V
≤60μs PULSE WIDTH
-60 -40 -20 0 20 40 60 80 100120140160180
TJ , Junction Temperature (°C)
0.5
1.0
1.5
2.0
R
D
S
(o
n)
,
D
ra
in
-t
o-
S
ou
rc
e
O
n
R
es
is
ta
nc
e
(
N
or
m
al
iz
ed
)
ID = 160A
VGS = 10V
1
10
100
VDS, Drain-to-Source Voltage (V)
1000
10000
100000
C
, C
ap
ac
ita
nc
e
(p
F
)
VGS = 0V, f = 1 MHZ
Ciss = Cgs + Cgd, C ds SHORTED
Crss = Cgd
Coss = Cds + Cgd
Coss
Crss
Ciss
0
50
100
150
200
250
300
QG, Total Gate Charge (nC)
0.0
2.0
4.0
6.0
8.0
10.0
12.0
14.0
V
G
S
, G
at
e-
to
-S
ou
rc
e
V
ol
ta
ge
(
V
)
VDS= 32V
VDS= 20V
ID= 160A
5
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IRF7739L1TRPbF
Fig 13. Typical Threshold Voltage vs.
Junction Temperature
Fig 12. Maximum Drain Current vs. Case Temperature
Fig 10. Typical Source-Drain Diode Forward Voltage
Fig11. Maximum Safe Operating Area
Fig 14. Maximum Avalanche Energy vs. Drain Current
0.0
0.5
1.0
1.5
2.0
2.5
3.0
VSD, Source-to-Drain Voltage (V)
1.0
10
100
1000
I S
D
, R
ev
er
se
D
ra
in
C
ur
re
nt
(
A
)
TJ = 25°C
TJ = 175°C
VGS = 0V
0
1
10
100
VDS, Drain-to-Source Voltage (V)
1
10
100
1000
10000
I D
,
D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
OPERATION IN THIS AREA
LIMITED BY R DS(on)
Tc = 25°C
Tj = 175°C
Single Pulse
100μsec
1msec
10msec
DC
25
50
75
100
125
150
175
TC , Case Temperature (°C)
0
50
100
150
200
250
300
I D
,
D
ra
in
C
ur
re
nt
(
A
)
-75 -50 -25 0 25 50 75 100 125 150 175 200
TJ , Temperature ( °C )
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
V
G
S
(t
h)
, G
at
e
th
re
sh
ol
d
V
ol
ta
ge
(
V
)
ID = 250μA
ID = 1.0mA
ID = 1.0A
25
50
75
100
125
150
175
Starting TJ , Junction Temperature (°C)
0
100
200
300
400
500
600
700
800
900
1000
1100
E
A
S
,
S
in
gl
e
P
ul
se
A
va
la
nc
he
E
ne
rg
y
(m
J)
ID
TOP 29A
46A
BOTTOM 160A
6
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IRF7739L1TRPbF
Fig 17.
Diode Reverse Recovery Test Circuit for N-Channel HEXFET
®
Power MOSFETs
Fig 15. Typical Avalanche Current vs. Pulsewidth
Fig 16. Maximum Avalanche Energy vs. Temperature
Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see
AN-1005
)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
jmax
. This is validated for
every part type.
2. Safe operation in Avalanche is allowed as long asT
jmax
is
not exceeded.
3. Equation below based on circuit and waveforms shown in
Figures 19a, 19b.
4. P
D (ave)
= Average power dissipation per single
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
av
= Allowable avalanche current.
7.
ΔT
=
Allowable rise in junction temperature, not to exceed
T
jmax
(assumed as 25°C in Figure 15, 16).
t
av =
Average time in avalanche.
D = Duty cycle in avalanche = t
av
·f
Z
thJC
(D, t
av
) = Transient thermal resistance, see figure 11)
P
D (ave)
= 1/2 ( 1.3·BV·I
av
) =
DT/ Z
thJC
I
av
=
2
DT/ [1.3·BV·Z
th
]
E
AS (AR)
= P
D (ave)
·t
a
P.W.
Period
di/dt
Diode Recovery
dv/dt
Ripple
≤ 5%
Body Diode Forward Drop
Re-Applied
Voltage
Reverse
Recovery
Current
Body Diode Forward
Current
V
GS
=10V
V
DD
I
SD
Driver Gate Drive
D.U.T. I
SD
Waveform
D.U.T. V
DS
Waveform
Inductor Curent
D =
P.W.
Period
*
V
GS
= 5V for Logic Level Devices
*
Inductor Current
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
• di/dt controlled by R
G
• Driver same type as D.U.T.
• I
SD
controlled by Duty Factor "D"
• D.U.T. - Device Under Test
+
-
+
+
+
-
-
-
R
G
V
DD
D.U.T
1.0E-06
1.0E-05
1.0E-04
1.0E-03
1.0E-02
1.0E-01
tav (sec)
0.1
1
10
100
1000
A
va
la
nc
he
C
ur
re
nt
(
A
)
0.05
Duty Cycle = Single Pulse
0.10
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming
ΔΤj = 25°C and
Tstart = 150°C.
0.01
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming
ΔTj = 150°C and
Tstart =25°C (Single Pulse)
25
50
75
100
125
150
175
Starting TJ , Junction Temperature (°C)
0
50
100
150
200
250
300
E
A
R
,
A
va
la
nc
he
E
ne
rg
y
(m
J)
TOP Single Pulse
BOTTOM 1.0% Duty Cy cle
ID = 160A
7
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IRF7739L1TRPbF
Fig 18a. Gate Charge Test Circuit
Fig 18b. Gate Charge Waveform
Fig 19b. Unclamped Inductive Waveforms
tp
V
(BR)DSS
I
AS
Fig 19a. Unclamped Inductive Test Circuit
Fig 20b. Switching Time Waveforms
Fig 20a. Switching Time Test Circuit
R G
IAS
0.01
Ω
tp
D.U.T
L
VDS
+
- VDD
DRIVER
A
15V
20V
V
GS
Vds
Vgs
Id
Vgs(th)
Qgs1
Qgs2
Qgd
Qgodr
1K
VCC
DUT
0
L
S
20K
V
DS
90%
10%
V
GS
t
d(on)
t
r
t
d(off)
t
f
V
DS
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
R
D
V
GS
R
G
D.U.T.
10V
+
-
V
DD
V
GS
8
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©
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IRF7739L1TRPbF
DirectFET
Board Footprint, L8 (Large Size Can).
Please see
AN-1035
for DirectFET assembly details and stencil and substrate design recommendations
G = GATE
D = DRAIN
S = SOURCE
G
D
S
D
D
D
D
D
S
S
S
S
S
S
S
Note: For the most current drawing please refer to IR website at
http://www.irf.com/package/
9
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©
2012 International Rectifier February 13 ,2013
IRF7739L1TRPbF
DirectFET
Part Marking
DirectFET
Outline Dimension, L8 Outline (LargeSize Can).
Please see
AN-1035
for DirectFET assembly details and stencil and substrate design recommendations
Note: For the most current drawing please refer to IR website at
http://www.irf.com/package/
PART NUMBER
LOGO
BATCH NUMBER
DATE CODE
Line above the last character of
the date code indicates "Lead-Free"
GATE MARKING
+
CODE
A
B
C
D
E
F
G
H
J
K
L
M
R
P
0.017
0.029
0.003
0.007
0.057
0.104
0.236
0.048
0.026
0.024
MAX
0.360
0.280
0.38
0.68
0.02
0.09
1.35
2.55
5.90
1.18
0.55
0.58
MIN
9.05
6.85
0.42
0.74
0.08
0.17
1.45
2.65
6.00
1.22
0.65
0.62
MAX
9.15
7.10
0.015
0.027
0.003
0.001
0.100
0.053
0.232
0.046
0.023
0.022
MIN
0.270
0.356
METRIC
IMPERIAL
DIMENSIONS
0.98
1.02
0.73
0.77
0.040
0.039
0.030
0.029
L1
0.215
5.35
5.45
0.211
10
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IRF7739L1TRPbF
DirectFET
Tape & Reel Dimension (Showing component orientation).
Note: For the most current drawing please refer to IR website at
http://www.irf.com/package/
LOADED TAPE FEED DIRECTION
NOTE: CONTROLLING
DIMENSIONS IN MM
CODE
A
B
C
D
E
F
G
H
IMPERIAL
MIN
4.69
0.154
0.623
0.291
0.283
0.390
0.059
0.059
MAX
12.10
4.10
16.30
7.60
7.40
10.10
N.C
1.60
MIN
11.90
3.90
15.90
7.40
7.20
9.90
1.50
1.50
METRIC
DIMENSIONS
MAX
0.476
0.161
0.642
0.299
0.291
0.398
N.C
0.063
+
Qualification standards can be found at International Rectifier’s web site
http://www.irf.com/product-info/reliability
Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http://www.irf.com/whoto-call/salesrep/
Applicable version of JEDEC standard at the time of product release.
*
Industrial qualification standards except autoclave test conditions
IR WORLD HEADQUARTERS: 101N Sepulveda Blvd, El Segundo, California 90245, USA
To contact International Rectifier, please visit
http://www.irf.com/whoto-call/
REEL DIMENSIONS
NOTE:
Controlling dimensions in mm
Std reel quantity is 4000 parts. (ordered as IRF7739L1TRPBF).
MAX
N.C
N.C
0.520
N.C
3.940
0.880
0.720
0.760
IMPERIAL
MIN
330.00
20.20
12.80
1.50
99.00
N.C
16.40
15.90
STANDARD OPTION (QTY 4000)
CODE
A
B
C
D
E
F
G
H
MAX
N.C
N.C
13.20
N.C
100.00
22.40
18.40
19.40
MIN
12.992
0.795
0.504
0.059
3.900
N.C
0.650
0.630
METRIC
Qualification level
MSL
1
(per JEDEC J-STD-020D
†††
)
RoHS Compliant
Yes
Moisture Sensitivity Level
DirectFET
Qualification Information
†
Industrial
†† *
Revision History
Date
Comments
2/12/2013
TR1 option removed and Tape & Reel Info updated accordingly. Hyperlinks added throw-out the document